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Interactive Corporation — Японская торговая компания, основанная в 1993 году, поставляет высокотехнологичное научное и промышленное оборудование ведущих японских, европейских и американских производителей.

Interactive Corporation — Авторизованный торговый агент компаний:
JEOL Ltd., Oxford Instruments, Gatan, Rigaku, Nikon Instech, Yamazaki Mazak.
Authorized Agent of JEOL Ltd. in Russia and CIS Countries

JPS-9010 Series

JPS-9010 Series

X-ray Photoelectron Spectroscopy (XPS) is an analytical technique to estimate the elemental composition and chemical state of the elements on the surface of a material by projecting soft X-ray onto the surface and detecting the energy of photoelectrons emitted from areas a few nm from the surface.

The photoelectron energy detected is specific to a certain element, and is determined by chemical bonding, reflecting chemical shift. Using X-rays as the source of excitation, XPS is effective in analyzing insulators.

XPS is a powerful analytical tool for material development and surface testing of a wide range of samples, including metals, semiconductors, high polymers, and advanced materials.

The JPS-9010 series offers three models to meet various research objectives and requirements: JPS-9010MC (with monochromatic X-ray source), JPS-9010MX, and JPS-9010TR featuring X-ray total reflection photoelectron spectroscopy (TRXPS), one of the first to incorporate this technique.

* High accuracy energy analyzer
* X-ray source to minimize damage to samples
* Compact X-ray monochromator
* Ultra high clean vacuum system; easy baking
* Versatile auto analysis to support routine analysis
* Large stage to accommodate large samples such as hard disk
* Easy to use software
* High speed peak separation software














JPS-9010 Series Specifications



Sensitivity and Resolution






















Intensity (cps) Resolution (eV)
Standard X-ray Source* 540,000 0.90
1,800,000 1.15
5,000,000 1.8
Monochromatic X-ray Source** 60,000 0.65




* When 3d5/s photoelectron spectra are acquired from a clean, flat silver sample with MgKa ray (converted to 300 W)
** When 3d5/s photoelectron spectra are acquired from a clean, flat silver sample with AlKa ray (converted to 600 W)


X-ray Source






































Standard X-ray Source
(Ai-Mg twin target)
Accelerating Voltage Max. 12 kV
Emission Current Max. 50 mA
Voltage Stability Within 1%
Maximum Load Mg 500W
Al 600W
Monochromatic X-ray Source
(X-ray monochromator)
Accelerating Voltage Max. 12 kV
Emission Current Max. 50 mA
Voltage Stability Within 1%
Maximum Load Al 600W
Analyzing Crystal SiO2
Rowland Circle 200 mm


Energy Analyzer and Incident Lens System































Incident Lens 3 stage cylindrical electrostatic lens
Hemispherical Analyzer Central orbit 100 mm
Incident Slit Slit width controller incorporated
Magnetic Shield Double mu metal shield
Energy Sweep Constant analyzer energy
Sweep Range 0 to 1480 eV
Energy Position Reproducibility ±0.05 eV
Detector Micro channel plate
Counting System Pulse count


Vacuum System






































Sample Imaging
Ultimate Pressure 7x10-8 Pa (5x10-10 Torr) maximum
Vacuum System Auto evacuation / baking sequence
Main Pump 200 lit/s ion pump
Supplementary Pump 1600 lit/s sublimation pump
Vacuum Monitor Nude ion gauge
Baking System Heater integrated
Specimen Exchange Chamber
High Speed Ion Gun Incorporated
Vacuum System Auto evacuation baking/sequence
Main Pump 2601 lit/s turbo molecular pump
Vacuum Monitor Penning gauge
















Московское представительство компании Interactive Corporation
115191 Россия, Москва, ул. Большая Тульская, д.10, стр. 2, офис 222
тел/факс: +7 (495) 748 20 07, +7 (495) 737 51 68, e-mail: iac@microanalysis.ru