JEM-2100F Transmission Electron Microscope

The JEM-2100F is an advanced Field Emission Electron Microscope featuring ultrahigh resolution and rapid data acquisition. The JEM 2100F is a next generation TEM that simplifies atomic level structural analyses in biology, medicine, and materials...

JSM-6390 Scanning Electron Microscope

The JSM-6390 is a high-performance, low cost, scanning electron microscope with a high resolution of 3.0nm. The customizable GUI interface allows the instrument to be intuitively operated, and Smile Shot™ software ensures optimum operation...

JSM-6390A Scanning Electron Microscope

The JSM-6390A is a high-performance, scanning electron microscope with an embedded energy dispersive X-ray analyzer (EDS) developed by JEOL which allows for seamless observation and EDS analysis. The take-off-angle for for the JSM-6390A is 35°,...

JSM-6390LA Scanning Electron Microscope

The JSM-6390LA is a high-performance, scanning electron microscope with an embedded energy dispersive X-ray analyzer (EDS) developed by JEOL which allows for seamless observation and EDS analysis. The take-off-angle for the JSM-6390LA is 35°, with...

JSM-6390LV Scanning Electron Microscope

The JSM-6390LV is a high-performance, low cost, scanning electron microscope with a high resolution of 3.0nm. The customizable GUI interface allows the instrument to be intuitively operated, and Smile Shot™ software ensures optimum operation...

JSM-6490 Scanning Electron Microscope

The JSM-6490 is a high-performance, scanning electron microscope with a high resolution of 3.0nm. Its asynchronous five-axis mechanically eucentric stage with compeucentric rotation and tilt can accommodate a specimen of up to 8-inches in diameter...

JSM-6490LA Scanning Electron Microscope

The JSM-6490LA is a high-performance, scanning electron microscope with an embedded energy dispersive X-ray analyzer (EDS) developed by JEOL which allows for seamless observation and EDS analysis. The take-off-angle for the JSM-6490LA is 35°, with...

JSM-6490LV Scanning Electron Microscope

The JSM-6490LV is a high-performance, scanning electron microscope with a high resolution of 3.0nm. The low vacuum mode (which can be accessed by the click of a mouse), allows for observation of specimens which cannot be viewed at high vacuum due...

JSM-6701F Scanning Electron Microscope

The JSM-6701F is a field emission scanning electron microscope (FESEM) incorporating a cold cathode field emission gun, ultra high vacuum, and sophisticated digital technologies for high resolution high quality imaging of micro structures....

JSM-7401F Scanning Electron Microscope

The JSM-7401F, JEOL's highest resolution SEM, is a field emission scanning electron microscope (FESEM) incorporating a cold cathode field emission gun, ultra high vacuum, and sophisticated digital technologies for high resolution, high quality...

JSM-7500F Scanning Electron Microscope

The JSM-7500F is an analytical Field Emission SEM featuring enhanced performance, ease of operation, and energy efficiency. The JSM-7500F offers the highest resolution at the lowest kV of any SEM available, achieving a resolution of 1.4 nm at 1...

JSM-7700F Scanning Electron Microscope

The JSM-7700F is the only aberration (Cs and Cc) corrected SEM on the market. The JSM-The JSM-7700F is the only aberration (Cs and Cc) corrected SEM on the market. The JSM-7700F also offers unprecedented resolution of 0.6nm at 5kV, and...