D/MAX RAPID II curved imaging plate systems for 2D X-ray scattering

The D/MAX RAPID II general purpose area detector system is designed for applications in general powder diffraction, micro-diffraction, wide angle X-ray scattering (WAXS), stress and texture measurements, and single crystal X-ray structure...

Mini-Z series of benchtop WDXRF analyzers

The Mini-Z series of compact benchtop wavelength dispersive XRF analyzers are designed for analyzing specific elements. Since the optics are optimally configured to a particular element, this series allows for high precision and ease...

MiniFlex™ II benchtop XRD system

Perform XRD measurements inexpensively

NANOHUNTER benchtop TXRF spectrometer

The new NANOHUNTER bench top total reflection X-ray fluorescence (TXRF) spectrometer, performs elemental analysis down to PPB levels. Winner of the 2007 R&D 100 Award for technical...

Primini® benchtop WDXRF spectrometer

The new Primini benchtop spectrometer represents the next stage in the evolution of Rigaku's line of WDXRF instrumentation. Using just three crystals, the Primini is capable of analysis from F⁹ to U⁹² in a...

PSPC/MSF rapid X-ray stress analyzer

Uses X-rays to non-destructively measures the residual stress accumulated in a material during the manufacturing process. Different frame sizes accommodate small, medium and large samples. The position-sensitive proportional counter (PSPC)...

Simultix 12

Rigaku introduces the Simultix 12, the newest version of our popular multi-channel simultaneous X-ray fluorescence spectrometer system. Based on over 30 years of accumulated experience, the Simultix 12 stands out as the most advanced, fully...

SmartLab®: Advanced high resolution measurements with simple operation

The SmartLab high-resolution diffraction system represents the state of the art in fully automated modular XRD systems. The system incorporates a high resolution theta/theta closed loop goniometer drive system, CBO, an in-plane scattering arm,...

TTRAX III theta/theta rotating anode XRD system

The TTRAX III is the world's most powerful θ/θ X-ray diffractometer. The system features an 18 kW rotating anode generator suited to the most demanding applications. Both thin film diffraction and the determination of trace phases in...

Ultima IV multipurpose X-ray diffraction system

The Ultima IV represents the state of the art in multipurpose X-ray diffraction (XRD) systems. Incorporating Rigaku's patented cross beam optics (CBO) technology for permanently mounted, permanently aligned and user-selectable parallel and...

ZSX 400 WDX spectrometer for large samples

Rigaku's ZSX 400 was specifically designed to handle very large and/or heavy samples. Accepting samples up to 400 mm diameter and 30 kg, this system is ideal for analyzing sputtering targets, magnetic disks, or for multilayer film metrology on the...

ZSX Primus II

The new ZSX Primus II features an innovative optics-above configuration. Never again worry about a contaminated beam path or down time due to sample chamber maintenance. The optics-above geometry eliminates cleaning worries and increases up time....